MEMS Fatigue Testing Machine

Utah State University is seeking a party interested in licensing a technology that makes it possible to carry out strength and fatigue tests on micro-sized materials. The properties of micro-portions of material often differ from those of larger specimens from which they are derived. Therefore new testing methods need to be implemented because conventional instruments cannot be miniaturized sufficiently to perform strength/fatigue tests on micro/nano samples of materials in an accurate and cost effective manner. Scientists at Utah State University have developed a method and a device that can produce reliable measurements of strain and fatigue characteristics of micro/nano scale samples. The data that can be collected by these devices will accelerate the development and reliability of MicroElectroMechanical Systems (MEMS), Composites, and Coatings that are used in applications and products such as: automotive safety systems (airbags, rollover detection), game controllers (Nintendo Wii, Apple iPhone), stain proof fibers in clothing, chemical detection, aerospace, national defense, biotechnology, communication, data storage, and energy harvesting. The MEMS market is growing very rapidly and revenue within the mobile device and automotive sectors alone is expected to reach $7.2 billion by 2015 (IHS, Nov. 2011).

Micro/Nano materials testing specifically for:

  • MEMS
  • Thin films
  • Nanocomposites
  • Nanocrystals
  • And more

  • Allows for accurate measurement of material properties that were previously cost prohibitive to obtain
  • Measures strain and stress simultaneously, reducing time and cost in material research and product development
  • Provides accurate results from cyclical and long-term fatigue tests
  • Configurable for specimen type and size

Patents/Publications:

US 8,132,466

Patent Information:
Category(s):
Electrical and Electronics
For Information, Contact:
Christian Iverson
Utah State University
435-797-9620
christian.iverson@usu.edu
Inventors:
Leila Ladani
Keywords:
Circuits and Systems Electrical Engineering/Electronics